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Cyprus, Nicosia Diocese, Nicosia (Nicosia Diocese) - view exact locationCategory
Product Information
Order volume from: On request
Delivery terms: Pickup
Description
Introducing the Wafer Measuring System, an innovative solution designed specifically for the wafer industry. With advanced features and high precision technology, this system guarantees accurate measurements of wafer displacement.
Here are the key details of the product:
1. Non-contact Coaxial Laser Displacement Sensor: This system utilizes a displacement-type non-contact coaxial laser displacement sensor for precise measurements.
2. Linear Motor High Precision Gantry Movement Mechanism: With a linear motor high precision gantry movement mechanism, this system ensures smooth and accurate movement during measurements.
3. Compatibility with Various Wafer Types: The system is compatible with both polished and unpolished, transparent and non-transparent wafers, making it suitable for a wide range of applications.
4. Flexibility in Wafer Size: The system supports wafer samples ranging from 1 to 8 inches, with the capacity to extend up to 300mm (12 inches) for larger products.
5. Coplanar Air Floating Mobile Bearing: The inclusion of a coplanar air floating mobile bearing guarantees exceptional flatness and smoothness during sample movement.
6. Measured Wafer Thickness: This system can measure the thickness of wafers within a range of 10um to 20mm, providing versatility for various wafer thicknesses.
7. Maximum Scanning Speed: The system boasts a maximum scanning speed of 1mu002Fs, ensuring efficient and timely measurements.
8. Comprehensive Measurement Parameters: The Wafer Measuring System is equipped with measurement parameters including thickness, TTV (Total Thickness Variation), LTV (Local Thickness Variation), TIR (Total Indicated Runout), Sori, Taper, Bow, and Warp, making it suitable for a wide range of measurement needs.
With its advanced features and compatibility with different wafer types and sizes, the Wafer Measuring System is an essential tool in the wafer industry, providing accurate and reliable measurements for quality control and process optimization.