Nova Outdoor noise measurement kit

Category

• Instruments For Measuring, Temperature Control >> Instrumentation >> Goods >> Thermometers, Pyrometers, Thermal Imagers

Description

Introducing our innovative Wafer Measuring System, designed specifically for the wafer industry. With its cutting-edge features and advanced technology, this system revolutionizes the process of measuring wafer thickness and various other parameters. 1. Our system utilizes a high-precision, non-contact coaxial laser displacement sensor to accurately measure displacement. This ensures precise and reliable measurements every time.2. Equipped with a linear motor high precision gantry movement mechanism, our system ensures smooth and precise movements during the measurement process. 3. Our system is versatile and adaptable, as it can measure both polished and unpolished, transparent and non-transparent wafers. No matter the type, our system provides accurate and consistent results.4. It is compatible with 1-8 inch wafer samples and can be extended to accommodate 300mm (12 inch) products. This wide range of compatibility ensures that our system can meet the needs of various wafer sizes.5. The inclusion of a coplanar air floating mobile bearing guarantees that the wafer moves with exceptional flatness and smoothness. This feature eliminates any potential distortion during the measurement process, ensuring accurate and reliable results.6. Our system can measure the thickness of a wafer ranging from 10um to 20mm, providing a wide range of measurement capabilities.7. With a maximum scanning speed of 1mu002Fs, our system enables efficient and rapid measurements, saving valuable time during the manufacturing process.8. The Wafer Measuring System also applies to various measurement parameters and standards such as thickness, TTV (Total Thickness Variation), LTV (Local Thickness Variation), TIR (Total Indicated Runout), Sori, Taper, Bow, and Warp. This comprehensive range of measurements ensures that our system meets all industry requirements.Invest in our Wafer Measuring System today and experience an unparalleled level of precision, efficiency, and reliability in wafer measure.