Schallpegelmesser

UK, Groß-London, London - siehe genauen Standort

Produktinformation

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Beschreibung

Introducing our state-of-the-art Wafer Measuring System, designed specifically for the demanding industry of wafer manufacturing. With its advanced features and precision technology, this system is set to revolutionize the way wafer measurements are conducted.This cutting-edge device incorporates a displacement-type non-contact coaxial laser displacement sensor to ensure accurate measurements. Its linear motor high precision gantry movement mechanism allows for smooth and precise movement of the wafer during measurements.Not only does our Wafer Measuring System excel in measuring polished and unpolished wafers, but it is also compatible with both transparent and non-transparent wafers. It can handle wafer samples ranging from 1 to 8 inches in size, with the capability to extend to 300mm (12 inch) products.To ensure the utmost precision, the system is equipped with a coplanar air floating mobile bearing that guarantees the wafer moves with exceptional flatness and smoothness.Our Wafer Measuring System is capable of measuring wafer thicknesses ranging from 10um to 20mm, providing comprehensive analysis for a variety of wafer types. Its maximum scanning speed of 1mu002Fs ensures efficient and speedy measurements.Not only does this system measure wafer thickness, but it also offers an array of measurement parameters and standards, including TTV, LTV, TIR, Sori, Taper, Bow, and Warp. This versatility makes it an invaluable tool for wafer manufacturing processes.Invest in our innovative Wafer Measuring System today and experience unmatched precision, efficiency, and reliability in your wafer measurements. Stay ahead of the competition with this industry-leading technology.