NanoTest PIC HD

Grundinformation

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Introducing the NanoTest PIC HD, a top-of-the-line opto-electronic test station designed specifically for the rigorous requirements of high-density photonics integrated circuits. This exceptional device is perfect for accurately and reliably characterizing DC and RF values in various industry-leading applications, including silicon photonics structures and active PICs. With its cutting-edge probe cards boasting an impressive capacity of several hundred contacts, seamless connections for both DC and RF measurements are effortlessly established. Trust the NanoTest PIC HD to deliver unmatched precision and efficiency in your opto-electronic characterization endeavors.